National Museums Scotland - SEM & Analytics Procurement
A Contract Award Notice
by NATIONAL MUSEUMS SCOTLAND
- Source
- Find a Tender
- Type
- Contract (Goods)
- Duration
- not specified
- Value
- ___
- Sector
- INDUSTRIAL
- Published
- 29 Dec 2021
- Delivery
- not specified
- Deadline
- n/a
Concepts
Location
National Museums Collection Centre, Granton, Ediburgh, EH5 1JA
1 buyer
- National Museums Scotland Edinburgh
1 supplier
- Unnamed None
Description
This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors to enable high-resolution imaging and analysis which can be used in concert to inform our understanding of a range of materials present in our collections (archaeological metallurgy, minerals, pigments, glass, enamels, organic materials etc).
Lot Division
1 | VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM) Please see full specification in attached Schedule 3-Invitation to Tender. Additional information: Please see full details in attached Schedule 3 - Invitation to Tender. |
2 | RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL) Please see full details in attached Schedule 3 - Invitation to Tender. Additional information: Please see full details in attached Schedule 3 - Invitation to Tender. |
3 | ENERGY-DISPERSIVE X-RAY MICROANALYSIS SYSTEM LOT 3: A) TRANSFER OF EXISTING ENERGY-DISPERSIVE X-RAY MICROANALYSIS SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDS SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER (WDS) AND ELECTRON BACKSCATTER DIFFRACTION (EBSD) MICROANALYSIS SYSTEM. Please see attached Schedule 3-Invitation to Tender for full details. Additional information: Please see attached Schedule 3-Invitation to Tender for full details. |
4 | FIELD EMISSION GUN A FIELD-EMISSION GUN SEM WITH VARIABLE PRESSURE WITH RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL); AS WELL AS AN A) TRANSFER OF EXISTING ENERGY-DISPERSIVE X-RAY MICROANALYSIS SYSTEM & SOFTWARE UPGRADE OR B) A NEW EDS SYSTEM; WAVELENGTH DISPERSIVE X-RAY SPECTROMETER (WDS); AS WELL AS AN ELECTRON BACKSCATTER DIFFRACTION (EBSD) MICROANALYSIS SYSTEM. Please see attached Schedule 3-Invitation to Tender for full details. Additional information: Please see attached Schedule 3-Invitation to Tender for full details. |
5 | FEG-SEM Equipment Including All Parts Please see Schedule 3- Invitation to Tender for full specification. Additional information: Please see Schedule 3- Invitation to Tender for full specification. |
Award Detail
1 | Unnamed (None)
|
2 | Unnamed (None)
|
3 | Unnamed (None)
|
4 | Unnamed (None)
|
5 | Unnamed (None)
|
Award Criteria
Quality | 60 |
price | 40 |
CPV Codes
- 38511100 - Scanning electron microscopes
Other Information
** PREVIEW NOTICE, please check Find a Tender for full details. ** Please see attached Schedule 3-Invitation to Tender for full details. (SC Ref:678416)
Reference
- ocds-h6vhtk-030520
- FTS 032378-2021