OrbiSIMS – simultaneous high-mass resolving power and high-spatial resolution mass spectrometry imaging for biological and advanced materials characterisation

Concepts

• teddington
• precision equipment
• high-mass
• high-spatial resolution mass spectrometry
• next generation orbisims technology
• time-of-flight mass spectrometer
• high-field orbitrap mass spectrometer
• high-speed
• spatial resolution
• ultra-high vacuum

Location

United Kingdom:

Description

NPL pioneered the next generation OrbiSIMS technology introduced in detail in Nature Methods (2017, PMID: 29131162). The instrument is equipped with a time-of-flight mass spectrometer (ToF) for high-speed imaging of large areas or in 3D. It is also equipped with a high-field Orbitrap mass spectrometer with a mass resolving power of >240,000 at m/z 200 and a mass accuracy of approximately 1 ppm. Both ToF and Orbitrap analysers can be used simultaneously or separately. The OrbiSIMS shall be able to carry out cryogenic analysis under ultra-high vacuum with sample holder temperatures below –150 oC.

Total Quantity or Scope

The OrbiSIMS instrument shall be equipped with a time-of-flight mass spectrometer (ToF) for high-speed imaging of large areas or in 3D. It shall also be equipped with a high-field Orbitrap mass spectrometer with a mass resolving power of >240,000 at m/z 200 and a mass accuracy of ~ 1 ppm. The instrument shall be equipped with 3 primary ion beams which are optimal for different materials systems. (1) A 20 kV gas cluster ion source with a spatial resolution < 2 µm used for biological imaging and depth-profiling of organic materials, (2) a low energy (250 eV to 2000 eV) dual source (Cs and O2) sputter beam with high-current (>50 nA at 500 eV with a spatial resolution < 40 µm) for depth profiling of semiconductor samples and (3) a 30 kV high-resolution Bi nanoprobe with a spatial resolution < 50 nm. The instrument shall be able to operate with either the ToF analyser or the Orbitrap analyser or a combination of the two as described in the Nat. Methods paper. (4) a Ga focused ion beam with accelerating voltages of up to 30 kV, minimum bema diameter of 60nm and beam current > 25 nA. The OrbiSIMS shall be equipped for cryogenic analysis (sample holder temperature < -150 oC) and be compatible with and including Leica sample holders and allow the docking of a Leica VCT-500 cryo transfer vessel. It shall have two high-resolution TV cameras for direct sample observation and rapid location of the area of interest, as well as a photo box for high-resolution sample navigation. In addition to mass analysers, the instrument shall have a pulsed high-quality Everhart-Thornley secondary electron detector, located at grazing incidence to the sample, for primary ion induced secondary electron imaging and a self-adjusting charge compensation system using a pulsed, low energy electron flood gun. Samples shall be mounted using a rapid sample introduction system, with one sample holder for rear mounting of up to 18 samples with maximum dimensions of 10 mm x 10 mm x 8 mm, including mounting accessories, one sample holder for top mounting of multiple samples on an area of 100 mm x 80 mm with a maximum thickness of up to 20 mm, and one sample holder for mounting samples for cryogenic analysis.

Award Detail

CPV Codes

• 38000000 - Laboratory, optical and precision equipments (excl. glasses)

Legal Justification

The OrbiSIMS concept was created at NPL and the first prototype instrument was built in a collaborative project with IONTOF and ThermoFisher Scientific. The instrument was subsequently commercialised by IONTOF and sold as the Hybrid SIMS. IONTOF are the only manufacturer of this type of instrument. A number of features of the OrbiSIMS instrument are protected by international patents. Unique features of the OrbiSIMS instrument include: 1. Imaging of biomolecules from tissue using a gas cluster ion beam with a spatial resolution of < 2 µm simultaneously with a mass resolving power of > 240,000 at m/z 200. 2. Depth resolution of < 10 nm of organic molecules in an organic multilayer reference sample simultaneously with a mass resolving power of > 240,000 at m/z 200. 3. Depth resolution of < 2 nm of ions in an inorganic semiconductor delta-layer reference sample simultaneously with a mass resolving power of > 240,000 at m/z 200. 4. Cryogenic imaging (see requirement 1) with a sample holder temperature of < -150 oC. Samples shall be mounted on Leica sample mounts. The instrument shall accept docking of a Leica VCT-500 cryo transfer vessel and have provision to receive samples into the instrument.

Other Information

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